Cryo-tomography tilt-series alignment with consideration of the beam-induced sample motion
نویسندگان
چکیده
منابع مشابه
Beam-induced motion correction for sub-megadalton cryo-EM particles
In electron cryo-microscopy (cryo-EM), the electron beam that is used for imaging also causes the sample to move. This motion blurs the images and limits the resolution attainable by single-particle analysis. In a previous Research article (Bai et al., 2013) we showed that correcting for this motion by processing movies from fast direct-electron detectors allowed structure determination to near...
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ژورنال
عنوان ژورنال: Journal of Structural Biology
سال: 2018
ISSN: 1047-8477
DOI: 10.1016/j.jsb.2018.02.001